Leica EM TIC 3X ion beam milling system
Sample preparation for demanding electron microscopy applications
Leica EM TIC 3X is an advanced ion beam milling system that enables the preparation of high-quality cross-sections and surfaces for electron microscopy. The triple broad ion beam system reveals true sample structures and delivers pristine surface quality for downstream analyses such as SEM, EDS, WDS, Auger, EBSD, and AFM investigations.
The instrument is highly versatile and suitable for preparing a wide range of samples, including hard, soft, brittle, heterogeneous, and heat-sensitive materials. The EM TIC 3X features interchangeable sample stages and a flexible design, allowing you to tailor the system to various research needs.
- Triple broad ion beam system
- Suitable for a wide variety of materials and structures
- Interchangeable sample stages and a broad range of accessories
Product is available in the following countries:
- Finland